Major responsibility is to prepare XSEM/STEM samples using FEI/Thermo Fisher 4xx/Helios Dual beam FIB tools and image using internal SEM/STEM detectors to meet the dynamic needs of process engineers.

Additional responsibilities may include FIB-SEM analysis, EDS, and Critical Dimension SEM (CDSEM) imaging.

2-4 years of experience with a BS degree in a physical science, or a specializedAS degree or equivalent professional training on materials science and analytical techniques.

Experience operating dual beam FIB/SEM tools, especially in the preparation of thin lamella for STEM or TEM imaging.

Knowledge of the physics involved with FIB/SEM tools, such as vacuum systems, voltage/current effects, and ion sputtering behavior.

Familiarity with key developments and materials in the semiconductor industry is a plus.

Experience creating and presenting technical documentation.

Experience in customer IP protection and sample handling is a plus.

We believe it is important for every person to feel valued, included, and empowered to achieve their full potential. By bringing unique individuals and viewpoints together, we achieve extraordinary results.

Lam Research ("Lam" or the "Company") is an equal opportunity employer. Lam is committed to and reaffirms support of equal opportunity in employment and non-discrimination in employment policies, practices and procedures on the basis of race, religious creed, color, national origin, ancestry, physical disability, mental disability, medical condition, genetic information, marital status, sex (including pregnancy, childbirth and related medical conditions), gender, gender identity, gender expression, age, sexual orientation, or military and veteran status or any other category protected by applicable federal, state, or local laws. It is the Company's intention to comply with all applicable laws and regulations. Company policy prohibits unlawful discrimination against applicants or employees.